New [ZHK] the displays Of epson for the mobile devices with the improved survey
The company Of epson Of imaging Of devices Of corporation today announced about the development Of photo Of fine HR of the transparent- reflecting [ZHK]- displays, prepared on the basis of the technology of the thin-film transistors from amorphous silicon (a -TFT), specially intended for the use in the mobile devices. The technology Of photo Of fine HR (High Of reflect - with the high reflection) it makes possible for displays to have immediately two advantages - low energy consumption and the high parameters of the survey of the under varied conditions surrounding illumination both external, and internal. The models of two new displays, prepared with the application of this technology, the company Of epson plans to begin to dispatch already at the end this month.
As producer declares, Photo Of fine HR combines in itself the technology of strong reflection, which it developed for a period of many years, and optical model, what as a result made it possible to attain dual effect in the display - high transparency and reflection. This allowed company to produce displays with the transmission coefficient of more than 6% and with the brightness of more than 200 [kd]/[m]2.
Epson Of imaging Of devices will demonstrate the announced displays on the exhibition FPD Of international 2008, which will pass from October 29 to 31 in Yokohama, Japan.
The technical characteristics of the represented novelties appear as follows:
As producer declares, Photo Of fine HR combines in itself the technology of strong reflection, which it developed for a period of many years, and optical model, what as a result made it possible to attain dual effect in the display - high transparency and reflection. This allowed company to produce displays with the transmission coefficient of more than 6% and with the brightness of more than 200 [kd]/[m]2.
Epson Of imaging Of devices will demonstrate the announced displays on the exhibition FPD Of international 2008, which will pass from October 29 to 31 in Yokohama, Japan.
The technical characteristics of the represented novelties appear as follows:
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